Author

Wen, Xiaoqing

Catalogue records by Wen, Xiaoqing in the PakCat Union Catalogue.

2 catalogue records

Catalogue records

VLSI test principles and architectures edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen 2006 VLSI test principles and architectures: design for testability edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen 2006