PakCat catalogue record

VLSI testing

01/01/2000 00:00

By Hurst, S. L.

Bibliographic details

ISBN
0852969015
Publisher
Institution of Electrical Engineers
Publication place
London
Publication year
1998
Language
English
Material type
Book
Physical description
xx, 532 p.

Subjects

Integrated circuits, Entegre devreler, Circuits intégrés à très grande échelle., Microélectronique., Prüftechnik., VLSI.

Related catalogue records

VLSI testing Hurst, S. L. Microelectronics Millman, Jacob Microelectronic circuit design Jaeger, Richard C. Microelectronic circuits Sedra, Adel S. Introduction to system design using integrated circuits Sonde, B. S. VLSI handbook Norman G. Einspruch Problems and Solutions in Integrated Electronics Gopal, R. Integrated electronics Millman, Jacob